BS EN 16018:2011 pdf download

BS EN 16018:2011 pdf download.Non-destructive testing -Terminology —Terms used in ultrasonic testing with phased arrays.
3.1.5annular array
array ofring-shapedelementsarrangedconcentrically where the major transmitting axis isaxial
NOTE See Fiqure 2.
3.1.5
annular sectorial array
arrular array with the rings divided into sectorsNOTE See Figure 3 and Figure 9.
3.1.7
encircling array
array aranged on a oomplete or partial circle,where the major transmitting axis is radial
NOTE See Figure 4 and Fiure 7.
3.1.8
convex array
encircling array typically used for the inspection oftubes from the inside
3.1.9
concave array
encircling array typically used for the inspection oftubes from the outside
3.1.10
dual array probe
probe with separae arrays for transmitling andreceiving
NOTE See Figure 5.
3.1.11
virtual probe
group ofindiwidual array elements operaledsimulaneously with adapted delay laws
3.1.12
matrix array
two-dimensional array of equall or non-equal sizedelememis
EXAMPLE See Figure 3.
3.1.13
2Dmatrix arrayrectangular matrix array
NOTE See Figure 6 and Figure 8.
3.1.14
pich
distance between the same edges or oentres of twoadjacent elemenits
NOTE For linear arays see Figure 10.
3.1.15
space between elementsgap between elements
distance between two adjacent elementsNOTE Fol linear arays see Fiure 10.
3.1.16
aclive aperture
group of active elements when transmitting andarrecliving
3.1.17
elementary aperture
active aperiture made of only one element
3.1.18
primary axis of an array
main axis for beam-steering parallel to the widath ofthe elements
NOTE See Figure 8.
3.1.19
secondary axis of an arrayaxis parpend cular to the primary axisNOTE See Fgure 8.
3.120
reference point on the wedge
coordinates of the point on the wedge which isused to position a defined point of the airay
3.121
sensitivity curve of an array
representafion of the sensitivity of each elementsu3ssively connected to the same channel, whenusing a flat reflector much langer than the apertureof the array
3.122
natural refracled beam angle
angle between the refracted beam axis and thencrmal to the interlace without electronic beam-steering
NOTE See Fiqure11.
3.1.23
deflection plane
or a planar test cbjecb plane in which a sectorialelectronic scanning is performed
3.128skewing rangerange of skew anglesNOTE See Fgure 12 bl.
3.123
tilting
dor a planar test objecb rotation of the delectionplane around its trace on the test cbject surlace
3.1.30
tlt angle
phased array techniques angle between thenormal to the surface of the test object and its
project in the plane of defection
NOTESee Fgure 12c.
3.1.31
tilting rangerange of tit anglesNOTE See Fgure 12.
3.1.32
dead element
elemenft which is no longer able to be active in an array.