BS ISO 15932:2013 pdf download

BS ISO 15932:2013 pdf download.Microbeam analysis —Analytical electron microscopy—Vocabulary.
2.1.3
electron lens
basic component of an electron optical system, using an electrostatic and/or electromagnetic field to change the trajectories of the electrons passing through it
2.1.3.1
electrostatic lens
electron lens employing an electrostatic held formed by a specific configuration of electrodes
2.1.3.2
electromagnetic lens
electron lens employing an electromagnetic field formed by a specflc configuration oFelectromagnetic coils (or permanent magnets) and pole pieces
ISOIJRCE: ISO 22493:2008, 3.1.3.2J
2.1.4
focusing
converging an electron beam to a minimum diameter using an electron lens
(SOURCE: ISO 22493, modificdJ
2.1.5
demagnificatlon
numerical value by which the diameter otthe electron beam exiting a lens is reduced in comparison to the diameter of the electron beam entering the lens
(SOURCE: ISO 22493:2008, 3.1.51
2.2
electron scattering
electron deflection with or without the loss of kinetic energy as a result of collision(s) with target atom(s)
or electron(s)
(SOURCE: ISO 22493 and ISO 23833, modified)
2.2.1
elastic scattering
electron scattering in which energy and momentum are conserved in the collision system
(SOURCE: ISO 22493:2008. 3.2.11
2.2.1.1
zero loss
unscattered and elastically scattered electrons (with only minimal loss of energy due to phonon excitation), giving rise to an intensity peak or the position or which defines zero in the electron energy loss spectrum
2.2.2
Inelastic scattering
electron scattering in which energy and/or momentum are not conserved in the collision system
Note 1 to entry: For Inelastic scattering, the electron tralectory is modified by plasmon loss, core loss, and other multiple scatterings
(SOURCE: ISO 22493, modifiedl
2.2.2.1
thermal diffuse scattering
electron scattering which is caused by clectron-phonon scattering due to thermal vibration oFthe lattice
2.2.2.2
plasmon loss
type of energy loss in EELS in which the incident electron Is affected by the collective oscillations of free electrons in the specimen and loses kinetic energy as a result
2.2.2.3
lnner•shell ionization
excitation of an electron bound in an inner-shell (nonvalence) orbital to an unbound state in the Continuum above the Fermi level
2.2.2.4
core loss
energy loss of an electron in the beam caused by excitation of an inner-shell electron
2.2.3
scattering cross-section
hypothetical area normal to the incident radiation that would geometrically intercept the total amount of radiation actually scattered by a scattering atom
Note ito entry: Scattering cross-section is usually expressed only as area
ISOIJRCE: ISO 22493:2008.3.2.3]
2.3
Bloch wave
wave function alan electron in a periodic crystal potential, which Is written as the product of a plane wave envelope function and a periodic function that has the same periodicity as the crystal potential
2.3.1
anomalous absorption
absorption of flInch wave in a crystalline material when the wave is symmetric and forms its antinodes at the nuclei
2.3.2
anomalous transmission
transmission of Bloch wave in a crystalline material when the wave is antisymmetric and forms its nodes at the nuclei
2.4
coherence
wave property exhibited by electron beams in which two waves share the same frequency and are in phase
Note I to entry: Phase shifts between two coherent beams result in i nterIerence and generate diffraction patterns.
2.5
TEM
microscopy technique or microscope where images of an Liltrathin specimen are obtained by an electron beam that is transmitted through it
2.5.1
HREM
method for obtaining lattice and crystal structure images by interfering with a transmitted electron wave and diffracted electron waves using an electromagnetic lens with a small spherical aberration
2.5.2
STEM
transmission electron microscopy technique which rasters the focused electron beam over the specimen
2.5.3
HAADF-STEM
imaging mode in a scanning transmission electron microscope in which images are formed by collectingvery high-angle, incoherently scattered electrons with an annular dark-field detector
2.5.4
LAADF-STEM
imaging mode in a scanning transmission electron microscope in which images are formed by collectinglow-angle elastic and inelastic scattering electrons with an annular dark-field detector
2.5.5
ABF-STEM
imaging technique of acquiring a bright-field scanning transmission electron microscope image with anannular detector
2.6
electron holography
application of holography techniques to electron waves in which the coherent beam is split into at leasttwo beams by using an electron biprism
2.6.1
electron prism
device which splits the coherent electron beam into several beams in order to obtain an interferogramor hologram
2.7
Lorentz electron microscopy
method for observing magnetic domain structures by use of the transmission electron microscope2.8
phase-contrast electron microscopy
TEM technique in which small phase shifts in the transmitted beam resulting from interactions with thespecimen are converted into amplitude or contrast changes in the image
2.9
electron tomography
reconstruction technique of a three-dimensional structure by the computer-assisted image processingof a series of projected images obtained by continuously tilting the specimen.
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