IEC 61076-5:2001 pdf download

IEC 61076-5:2001 pdf download.Connectors for use in d.c. low-frequency analogue and digital high-speed data applications – Part 5:In-line sockets with assessed quality – Sectional specification.
2.3 Information to be given in a detail specification
The detail specification shall be derived from the relevant blank detail specification and shall contain all required information. Detail specifications shall not specify requirements inferior to those of the generic or sectional specifications. When more severe requirements are included. they shall be listed in the detail specification and indicated in the test schedules; for example. by an asterisk.
The detail specification shall contain the complete technical requirements I or inspection. Including the quality conformance test schedule. It the technical requirements of the generic and!or sectional specification relative to inspection are not entirely suitable (either for technical reasons or for special applications) to the component described In the detail specification, the detail specification shall set out clearly the various amendments which are to be made to these requirements.
2.4 Standard values
The range for voltage shall not exceed 1 000 V (d.c. or peak a.c). The current rating shall not exceed 2 A. Specific voltage and current ratings shall be as defined in the detail specification.
2.5 ClassIfication
Sockets covered by this sectional specification shall be classified with respect to termination
type, contact style, insulator body configuration, and decoupling capacitor style.
2.5.1 TermInation types
a) Solderless wrap terminals,
b) Printed circuit terminals.
C) Surface mount terminals.
2.5.2 Contact style
a) Two-piece contact. A contact assembly with a closed-bottom seamless outer sleeve and a mullifinger inner spring contact.
b) Stamped and formed contact. A contact which in Its entirety Is made by stamping and forming.
C) Two-piece sealed entry contact. A two-piece contact assembly with a multifinger inner contact and a closed bottom seamless outer sleeve, The lead entry is sealed against external contaminants.
2.5.3 Insulator body configuration
a) Solid body — no mounting holes.
b) Open frame.
c) Solid body with mounting holes,
d) Flexible plastic socket carrier.
e) Rigid plastic socket carrier.
f) Rigid metal socket carrier.
g) Rigid plastic with metal-pin socket carrier.
h) Angled mounting.
2.5.4 D.coupling capacitor
a) Axial lead moulded.
b) Axial lead ceramic,
C) Parallel lead moulded.
d) Parallel lead ceramic.
e) Surface mount chip.
f) Surface mount flatpack.
The complele classification of an in-line socket shall consist of all three primary characteristics and decoupling capacitor style where applicable. For example, a DIP (Dual In. line Package) socket with printed circuit terminals, stamped and formed contact, open-frame insulator body configuration and axial lead ceramic decoupling capacitor shall have a classification B282.
3 Quality assessment procedures
3.1 General
The qualilication inspection tests are prescribed in table 2. When additional test groups are prescribed by the detail specification, the identity of the test group, Ihe sequence of tests, and the minimum sample quantity shall be In accordance with table 2. When the detail specification prescribes tests not in table 2, it shall include the additional test either within an existing test group or as an additional test group. No failures are permitted. In the event that qualification is sought on a variant of a previously qualified socket, qualification inspection shall be limited to those tests for which the test results on previously qualified sockets are not valid for the variant.
3.2 Primary stage of manufacturing
The primary stage of manufacture is the first process subsequent to the manufacture of finished piece parts and subassemblies A subassembly is defined as the permanent assembly of two or more piece parts.
3,3 Structurally similar sockets
Structurally similar sockets shall be as prescribed in the generic specification.
34 Lot-by-lot inspection tests
The lot-by-lot inspection tests are prescribed in table & The sequence of tests is optional unless otherwise specified in the detail specification.
3.5 Periodic inspection tests
The periodic inspection tests are prescribed in table 5.
3.6 Alternative test methods
Alternative test methods shall be as described in the generic specification.