IEEE C37.41-2000 pdf download
IEEE C37.41-2000 pdf download.IEEE Standard Design Tests for High-Voltage Fuses, Distribution Enclosed Single-Pole Air Switches,Fuse Disconnecting Switches, and Accessories.
3.1 Device tests
For devices covered by this standard, all applicable tests need not be performed on each design modification of a previous qualified design. To assure that overall performance has not been adversely affected as a result of the design modification, sufficient tests shall he performed to ensure that the modified design will have a performance that meets or exceeds the ratings and performance requirements of the standards specified in Clause 3. For devices that have been assigned ratings or performance requirements that are different from the standards specified in Clause 3, the modified design shall have ratings and performance requirements that meet or exceed the values assigned to the original device.
Fuses connected in parallel shall he considered a separate design and he tested accordingly.
3.2 FEP tests
The design tests for FEPs are performed to determine the adequacy of a particular type of design, style, or model of equipment to meet its assigned ratings and for satisfactory operation. In general, a fuse need not he tested if it has already been tested in an equivalent enclosure.
3.3 Test values
3.3.1 Allowable tolerances
Testing parameters in this document and the specification documents for each device are listed as a value with an allowable plus tolerance, a value with an allowable minus tolerance, a minimum value, or a range. When a range is specified, the test may he performed anywhere within that range. When a minimum value or a value with a plus tolerance is specified, the manufacturer may perform the test at any value that equals or exceeds the minimum value. When a value with a minus tolerance is specified the manufacturer may perform the test at any value that is equal to or less than the maximum value allowed. When a minimum value or a tolerance is specified, testing by persons other than the manufacturer shall he at the specified value, or permission to test at a different level shall he obtained from the manufacturer.
3.3.2 Preferred values
In this standard and the specification standards referred to herein, the ratings and performance requirements represent preferred values and requirements. Special circuit or environmental conditions may require devices with ratings and performance that are different from the preferred values and requirements specified in these documents. For these devices, the ratings and performance requirements shall be agreed upon by the user and the manufacturer.
3.4 Testing responsibility
A fuse or switch manufacturer shall test their device and supply the appropriate application data. An FEP manufacturer is responsible for ensuring that appropriate testing has been performed and for supplying the appropriate application data.
4. Common test requirements
The requirements of Clause 4 are common to all tests. Where the conditions for a specific test deviate from these common test requirements, they are identified in the specific suhclause for the test.
4.1 Test site conditions
4.1.1 Ambient temperature during test
The ambient temperature prevailing at the test site shall conform to usual service conditions, in accordance with 2.1 of IEEE Std C37.40-1993.
4.1.2 Atmospheric conditions during test
Tests shall be conducted under atmospheric conditions prevailing at the time and place of the test. It is recommended that the barometric pressure and dry and wet bulb thermometer readings he recorded so that applicable correction factors can he applied to the measurements.
4.2 Frequency and wave shape of test voltage
4.2.1 Frequency of test voltage
The frequency for all power-frequency tests shall be (50 ± 2) Hz or (60 ± 2) Hz, except as otherwise specified.
4.2.2 Wave shape of test voltage
A sine wave of acceptable commercial standards shall be applied to the device. For the definition of the wave shape, see IEEE Std 4-1995.
4.3 Devices to be tested
4.3.1 Condition of device to be tested
The device shall he new and in good condition, and tests shall he applied before the device is put into commercial service, unless otherwise specified.
